[IEEE 2015 IEEE International Symposium on Electromagnetic Compatibility - EMC 2015 - Dresden, Germany (2015.8.16-2015.8.22)] 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC) - How SI/EMC and reliability issues could interact together in embedded electronic systems?
Weide-Zaage, Kirsten, Moujbani, Aymen, Duchamp, Genevieve, Dubois, Tristan, Verdier, Frederic, Fremont, HeleneYear:
2015
Language:
english
DOI:
10.1109/ISEMC.2015.7256363
File:
PDF, 1.21 MB
english, 2015