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Research on Electrical Network Blackout Risk under Different Connection Patterns
Liu, Zi Fa, Ren, Xue Dong, Chen, Yi Xiao, Chen, Chi Ye, Zhang, Xiao Qing, Niu, Fang MingVolume:
799-800
Language:
english
Journal:
Applied Mechanics and Materials
DOI:
10.4028/www.scientific.net/AMM.799-800.1232
Date:
October, 2015
File:
PDF, 317 KB
english, 2015