On the reliability estimation of nano-circuits using neural...

Microprocessors and Microsystems 2015 / 11 Vol. 39; Iss. 8

On the reliability estimation of nano-circuits using neural networks

Beg, Azam, Awwad, Falah, Ibrahim, Walid, Ahmed, Faheem
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Volume:
39
Language:
english
Journal:
Microprocessors and Microsystems
DOI:
10.1016/j.micpro.2015.09.008
Date:
November, 2015
File:
PDF, 1.23 MB
english, 2015
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