[IEEE 18th International Conference on Pattern Recognition (ICPR'06) - Hong Kong, China ()] 18th International Conference on Pattern Recognition (ICPR'06) - Independent component analysis based filter design for defect detection in low-contrast textured images
Du-Ming Tsai,, Yan-Hsin Tseng,, Shin-Min Chao,, Chao-Hsuan Yen,Year:
2006
Language:
english
DOI:
10.1109/ICPR.2006.709
File:
PDF, 351 KB
english, 2006