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SPIE Proceedings [SPIE First European Conference on Optics Applied to Metrology - Strasbourg, France (Wednesday 26 October 1977)] 1st European Conf on Optics Applied to Metrology - Interferometer For Testing Infrared Materials And Optical Systems
Lamare, Michel, Grosmann, Michel H., Meyrueis, PatrickVolume:
136
Year:
1978
Language:
english
DOI:
10.1117/12.956137
File:
PDF, 640 KB
english, 1978