Genome-wide association mapping reveals novel sources of...

Genome-wide association mapping reveals novel sources of resistance to northern corn leaf blight in maize

Ding, Junqiang, Ali, Farhan, Chen, Gengshen, Li, Huihui, Mahuku, George, Yang, Ning, Narro, Luis, Magorokosho, Cosmos, Makumbi, Dan, Yan, Jianbing
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Volume:
15
Language:
english
Journal:
BMC Plant Biology
DOI:
10.1186/s12870-015-0589-z
Date:
December, 2015
File:
PDF, 1.38 MB
english, 2015
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