High-frequency conductivity of optically excited charge...

Thin Solid Films 2015 / 10 Vol. 592

High-frequency conductivity of optically excited charge carriers in hydrogenated nanocrystalline silicon investigated by spectroscopic femtosecond pump–probe reflectivity measurements

He, Wei, Yurkevich, Igor V., Zakar, Ammar, Kaplan, Andrey
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Volume:
592
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2015.03.023
Date:
October, 2015
File:
PDF, 921 KB
english, 2015
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