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[IEEE 2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2014.11.2-2014.11.6)] 2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Fast and accurate emissivity and absolute temperature maps measurement for integrated circuits
Yu, Hsueh-Ling, Li, Yih-Lang, Liao, Tzu-Yi, Wang, Tianchen, Shi, Yiyu, Tsai, Shu-FeiYear:
2014
Language:
english
DOI:
10.1109/ICCAD.2014.7001403
File:
PDF, 1.62 MB
english, 2014