![](/img/cover-not-exists.png)
Bayesian analysis for masked system failure data using non-identical Weibull models
Sanjib Basu, Asit P., Basu, Chiranjit MukhopadhyayVolume:
78
Year:
1999
Language:
english
Pages:
21
DOI:
10.1016/s0378-3758(98)00218-3
File:
PDF, 309 KB
english, 1999