Bayesian analysis for masked system failure data using...

Bayesian analysis for masked system failure data using non-identical Weibull models

Sanjib Basu, Asit P., Basu, Chiranjit Mukhopadhyay
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Volume:
78
Year:
1999
Language:
english
Pages:
21
DOI:
10.1016/s0378-3758(98)00218-3
File:
PDF, 309 KB
english, 1999
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