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[IEEE 2010 22nd International Conference on Tools with Artificial Intelligence (ICTAI) - Arras, France (2010.10.27-2010.10.29)] 2010 22nd IEEE International Conference on Tools with Artificial Intelligence - PERFICT: Perturbed Frequent Itemset Based Classification Technique
Mall, Raghvendra, Jain, Prakhar, Pudi, VikramYear:
2010
Language:
english
DOI:
10.1109/ICTAI.2010.20
File:
PDF, 278 KB
english, 2010