SPIE Proceedings [SPIE Optics & Photonics 2005 - San...

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SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, CA (Sunday 31 July 2005)] Mathematical Methods in Pattern and Image Analysis - A solution to arc correction in cylindrical PET scanner

Farsaii, Babak, Astola, Jaakko T., Tabus, Ioan, Barrera, Junior
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Volume:
5916
Year:
2005
Language:
english
DOI:
10.1117/12.618140
File:
PDF, 555 KB
english, 2005
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