![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Integrated Optoelectronic Devices 2007 - San Jose, CA (Saturday 20 January 2007)] Gallium Nitride Materials and Devices II - Thermal analysis of AlGaN/GaN HFETs using electro-thermal simulation and micro-Raman spectroscopy
Fujishima, Tatsuya, Inoue, Kaoru, Kosaka, Kenichi, Hinoki, Akihiro, Yamada, Tomoyuki, Tsuchiya, Tadayoshi, Kikawa, Junjiroh, Kamiya, Shinichi, Suzuki, Akira, Araki, Tsutomu, Nanishi, Yasushi, Morkoc,Volume:
6473
Year:
2007
Language:
english
DOI:
10.1117/12.699760
File:
PDF, 1.19 MB
english, 2007