Lifetime estimation of high-temperature high-voltage...

Microelectronics Reliability 2015 / 08 Vol. 55; Iss. 9-10

Lifetime estimation of high-temperature high-voltage polymer film capacitor based on capacitance loss

Makdessi, M., Sari, A., Venet, P., Aubard, G., Chevalier, F., Préseau, R., Doytchinov, T., Duwattez, J.
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Volume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.06.099
Date:
August, 2015
File:
PDF, 449 KB
english, 2015
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