Simulation study on the lifetime of electrochemical...

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Microelectronics Reliability 2015 / 10

Simulation study on the lifetime of electrochemical capacitors using the accelerated degradation test under temperature and voltage stresses

Kim, Yu Tack, Kim, Kwang-Bum, Hyun, Yoo Eo, Kim, Ick-Jun, Yang, Sunhye
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Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.09.032
Date:
October, 2015
File:
PDF, 2.70 MB
english, 2015
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