SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] Stray Radiation in Optical Systems III - Instrumentation at the National Institue of Standards and Technology for bidirectional reflectance distribution function (BRDF) measurements
Asmail, Clara C., Cromer, Christopher L., Proctor, James, Hsia, Jack J., Breault, Robert P.Volume:
2260
Year:
1994
Language:
english
DOI:
10.1117/12.189203
File:
PDF, 683 KB
english, 1994