Full-field X-ray reflection microscopy of epitaxial...

Journal of Synchrotron Radiation 2014 / 11 Vol. 21; Iss. 6

Full-field X-ray reflection microscopy of epitaxial thin-films

Laanait, Nouamane, Zhang, Zhan, Schlepütz, Christian M., Vila-Comamala, Joan, Highland, Matthew J., Fenter, Paul
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Volume:
21
Language:
english
Journal:
Journal of Synchrotron Radiation
DOI:
10.1107/S1600577514016555
Date:
November, 2014
File:
PDF, 984 KB
english, 2014
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