[IEEE 2015 IEEE International Radar Conference (RadarCon) - Arlington, VA, USA (2015.5.10-2015.5.15)] 2015 IEEE Radar Conference (RadarCon) - The keystone transform: Practical limits and extension to second order corrections
Scott, Kevin M., Barott, William C., Himed, BrahamYear:
2015
Language:
english
DOI:
10.1109/RADAR.2015.7131189
File:
PDF, 1.29 MB
english, 2015