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[IEEE Digest of Technical Papers. PPC-2003. 14th IEEE International Pulsed Power Conference (IEEE Cat. No.03CH37472) - Dallas, Texas, USA (June 15-18, 2003)] Digest of Technical Papers. PPC-2003. 14th IEEE International Pulsed Power Conference (IEEE Cat. No.03CH37472) - A critical analysis of IGBT geometries, with the intention of mitigating undesirable destruction caused by fault scenarios of an adverse nature
Leyh, G.E.Volume:
1
Year:
2003
Language:
english
DOI:
10.1109/PPC.2003.1277730
File:
PDF, 307 KB
english, 2003