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Direct Spectroscopic Evidence of Bias-Induced Shifts of Semiconductor Band Edges for Metal-Insulator-Semiconductor Diodes
Kobayashi, Hikaru, Yamashita, Yoshiyuki, Namba, Kenji, Nakato, YoshihiroVolume:
33
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.33.l754
Date:
May, 1994
File:
PDF, 452 KB
1994