An evaluation of a commercial Échelle spectrometer with intensified charge-coupled device detector for materials analysis by laser-induced plasma spectroscopy
Vincent Detalle, René Héon, Mohamad Sabsabi, Louis St-OngeVolume:
56
Year:
2001
Language:
english
Pages:
15
DOI:
10.1016/s0584-8547(01)00174-4
File:
PDF, 940 KB
english, 2001