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Grazing-angle incidence X-ray diffraction by Si1−α(x)Geα(x) thin layer if the composition coefficient α(x) is varying harmonically along the flat entrance surface
P.A. Bezirganyan Jr., A.P. Bezirganyan, S.E. Bezirganyan, H.A. Bezirganyan Jr., K.O. HovnanyanVolume:
58
Year:
2003
Language:
english
Pages:
13
DOI:
10.1016/s0584-8547(02)00291-4
File:
PDF, 1.82 MB
english, 2003