Direct determination of trace elements in tungsten products...

Direct determination of trace elements in tungsten products using an inductively coupled plasma optical emission charge coupled device detector spectrometer

Yang Xiuhuan, Wei Jinfang, Liu Hongtao, Tang Baoying, Zhang Zhanxia
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Volume:
53
Year:
1998
Language:
english
Pages:
8
DOI:
10.1016/s0584-8547(98)00144-x
File:
PDF, 187 KB
english, 1998
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