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Direct determination of trace elements in tungsten products using an inductively coupled plasma optical emission charge coupled device detector spectrometer
Yang Xiuhuan, Wei Jinfang, Liu Hongtao, Tang Baoying, Zhang ZhanxiaVolume:
53
Year:
1998
Language:
english
Pages:
8
DOI:
10.1016/s0584-8547(98)00144-x
File:
PDF, 187 KB
english, 1998