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Measurement of trace element concentration in a metal matrix using total reflection X-ray fluorescence spectrometry
J. van Aarle, R. Abela, F. Hegedüs, C. Streli, M. Victoria, P. Winkler, P. WobrauschekVolume:
54
Year:
1999
Language:
english
Pages:
5
DOI:
10.1016/s0584-8547(99)00099-3
File:
PDF, 175 KB
english, 1999