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Atomic-scale characterization of Si(110)/6H-SiC(0001) heterostructure by HRTEM
Li, L.B., Chen, Z.M., Zang, Y., Feng, S.Volume:
163
Language:
english
Journal:
Materials Letters
DOI:
10.1016/j.matlet.2015.10.017
Date:
January, 2016
File:
PDF, 810 KB
english, 2016