Atomic-scale characterization of Si(110)/6H-SiC(0001)...

Materials Letters 2016 / 01 Vol. 163

Atomic-scale characterization of Si(110)/6H-SiC(0001) heterostructure by HRTEM

Li, L.B., Chen, Z.M., Zang, Y., Feng, S.
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Volume:
163
Language:
english
Journal:
Materials Letters
DOI:
10.1016/j.matlet.2015.10.017
Date:
January, 2016
File:
PDF, 810 KB
english, 2016
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