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Investigation on the effect of external mechanical stress on the DC characteristics of GaAs microwave devices
Adokanou, K., Inal, K., Montmitonnet, P., Pressecq, F., Bonnet, B., Muraro, J.-L.Volume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.06.033
Date:
August, 2015
File:
PDF, 1.16 MB
english, 2015