![](/img/cover-not-exists.png)
Optical characterization and carriers transfer between localized and delocalized states in Si-doped GaAsN/GaAs epilayer
Hassen, F., Zaaboub, Z., Bouhlel, M., Naffouti, M., Maaref, H., Garni, N.M.Volume:
594
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2015.10.028
Date:
November, 2015
File:
PDF, 368 KB
english, 2015