Applications of a versatile modelling approach to 3D atom probe simulations
Oberdorfer, Christian, Eich, Sebastian Manuel, Lütkemeyer, Martin, Schmitz, GuidoLanguage:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2015.02.008
Date:
February, 2015
File:
PDF, 11.75 MB
english, 2015