Measuring the quality of linear patterns in biclusters

Methods 2015 / 07 Vol. 83

Measuring the quality of linear patterns in biclusters

Chen, Shuhua, Liu, Juan, Zeng, Tao
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Volume:
83
Language:
english
Journal:
Methods
DOI:
10.1016/j.ymeth.2015.04.005
Date:
July, 2015
File:
PDF, 2.73 MB
english, 2015
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