Stress distribution around the ion-induced channels in chemical vapor deposited diamond films: a micro-Raman study
P. S. Dobal, M. S. Navati, H. D. Bist, T. Som, V. N. KulkarniVolume:
29
Year:
1998
Language:
english
Pages:
8
DOI:
10.1002/(sici)1097-4555(199807)29:73.0.co;2-j
File:
PDF, 343 KB
english, 1998