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[IEEE 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - Amherst, MA, USA (2015.10.12-2015.10.14)] 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - Towards reliability and performance-aware Wireless Network-on-Chip design
Agyeman, Michael Opoku, Tong, Kin-Fai, Mak, TerrenceYear:
2015
Language:
english
DOI:
10.1109/dft.2015.7315163
File:
PDF, 8.30 MB
english, 2015