![](/img/cover-not-exists.png)
[IEEE 2008 International Conference on Wavelet Analysis and Pattern Recognition (ICWAPR) - Hong Kong, China (2008.08.30-2008.08.31)] 2008 International Conference on Wavelet Analysis and Pattern Recognition - Two-dimensional locality sensitive discriminant analysis
Yantao Wei,, Hong Li,, Tian Xia,Year:
2008
Language:
english
DOI:
10.1109/icwapr.2008.4635815
File:
PDF, 216 KB
english, 2008