[IEEE 2008 International Conference on Wavelet Analysis and...

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[IEEE 2008 International Conference on Wavelet Analysis and Pattern Recognition (ICWAPR) - Hong Kong, China (2008.08.30-2008.08.31)] 2008 International Conference on Wavelet Analysis and Pattern Recognition - Two-dimensional locality sensitive discriminant analysis

Yantao Wei,, Hong Li,, Tian Xia,
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Year:
2008
Language:
english
DOI:
10.1109/icwapr.2008.4635815
File:
PDF, 216 KB
english, 2008
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