Comparison of analytic distribution function models for...

Microelectronics Reliability 2015 / 08 Vol. 55; Iss. 9-10

Comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs

Sharma, P., Tyaginov, S., Wimmer, Y., Rudolf, F., Rupp, K., Enichlmair, H., Park, J.-M., Ceric, H., Grasser, T.
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Volume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.06.021
Date:
August, 2015
File:
PDF, 1.37 MB
english, 2015
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