ASTEP (2005–2015): Ten years of soft error and atmospheric...

Microelectronics Reliability 2015 / 08 Vol. 55; Iss. 9-10

ASTEP (2005–2015): Ten years of soft error and atmospheric radiation characterization on the Plateau de Bure

Autran, J.L., Munteanu, D., Moindjie, S., Saoud, T. Saad, Sauze, S., Gasiot, G., Roche, P.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.06.101
Date:
August, 2015
File:
PDF, 1.39 MB
english, 2015
Conversion to is in progress
Conversion to is failed