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Uncertainty quantification in DIC with Kriging regression
Wang, Dezhi, DiazDelaO, F.A., Wang, Weizhuo, Lin, Xiaoshan, Patterson, Eann A., Mottershead, John E.Volume:
78
Language:
english
Journal:
Optics and Lasers in Engineering
DOI:
10.1016/j.optlaseng.2015.09.006
Date:
March, 2016
File:
PDF, 10.59 MB
english, 2016