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[IEEE 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) - San Diego, CA, USA (2015.5.26-2015.5.29)] 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) - Investigation of WLCSP corrosion induced reliability failure on halogens environment for wearable electronics
Chen, J. H., Kuo, Y. L., Tsao, P. H., Tseng, Jerry, Chen, Megan, Chen, T. M., Lin, Y. T., Xu, AntaiYear:
2015
Language:
english
DOI:
10.1109/ECTC.2015.7159810
File:
PDF, 1.06 MB
english, 2015