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Effect of self-organization, defects, impurities, and autocatalytic processes on the parameters of ZnO films and nanorods
Mezdrogina, M. M., Eremenko, M. V., Levitskii, V. S., Petrov, V. N., Terukov, E. I., Kaidashev, E. M., Langusov, N. V.Volume:
49
Language:
english
Journal:
Semiconductors
DOI:
10.1134/S1063782615110159
Date:
November, 2015
File:
PDF, 1.22 MB
english, 2015