Low-Energy-Electron-Diffraction and...

Japanese Journal of Applied Physics 2011 / 7 Vol. 50; Iss. 7

Low-Energy-Electron-Diffraction and X-ray-Phototelectron-Spectroscopy Studies of Graphitization of 3C-SiC(111) Thin Film on Si(111) Substrate

Takahashi, Ryota, Handa, Hiroyuki, Abe, Shunsuke, Imaizumi, Kei, Fukidome, Hirokazu, Yoshigoe, Akitaka, Teraoka, Yuden, Suemitsu, Maki
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Volume:
50
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.50.070103
Date:
July, 2011
File:
PDF, 725 KB
english, 2011
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