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[IEEE 2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Singapore, Singapore (2015.6.1-2015.6.4)] 2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Analysis of electro-thermal instability in bipolar transistors
Balanethiram, Suresh, Chakravorty, AnjanYear:
2015
Language:
english
DOI:
10.1109/EDSSC.2015.7285216
File:
PDF, 213 KB
english, 2015