![](/img/cover-not-exists.png)
[IEEE 2008 International Conference on Microwave and Millimeter Wave Technology (ICMMT) - Nanjing, China (2008.04.21-2008.04.24)] 2008 International Conference on Microwave and Millimeter Wave Technology - Investigation of the effect of conductor loss and mismatch on the tunneling through frequency selective surfaces
Zareian-Jahromi, Ehsan, Shahabadi, MahmoudYear:
2008
Language:
english
DOI:
10.1109/ICMMT.2008.4540446
File:
PDF, 470 KB
english, 2008