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[IEEE 2015 IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2015.5.17-2015.5.20)] 2015 IEEE International Memory Workshop (IMW) - A Study of Blocking and Tunnel Oxide Engineering on Double-Trapping (DT) BE-SONOS Performance
Lo, Roger, Du, Pei-Ying, Hsu, Tzu-Hsuan, Wu, Chen-Jun, Guo, Jung-Yi, Cheng, Chun-Min, Lue, Hang-Ting, Shih, Yen-Hao, Hou, Tuo-Hung, Hsieh, Kuang-Yeu, Lu, Chih-YuanYear:
2015
Language:
english
DOI:
10.1109/IMW.2015.7150273
File:
PDF, 441 KB
english, 2015