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[IEEE 2015 IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2015.5.17-2015.5.20)] 2015 IEEE International Memory Workshop (IMW) - Visualization of Conductive Filament during Write and Erase Cycles on Nanometer-Scale ReRAM Achieved by In-Situ TEM
Takahashi, Yasuo, Kudo, Masaki, Fujiwara, Ichiro, Shimuta, Masayuki, Ohba, Kazuhiro, Arita, MasashiYear:
2015
Language:
english
DOI:
10.1109/IMW.2015.7150312
File:
PDF, 1.08 MB
english, 2015