[IEEE 2015 International Workshop on Computational Electronics (IWCE) - West Lafayette, IN, USA (2015.9.2-2015.9.4)] 2015 International Workshop on Computational Electronics (IWCE) - Strong negative differential resistance in graphene devices with local strain
Nguyen, M. Chung, Nguyen, Viet-Hung, Saint-Martin, Jerome, Dollfus, PhilippeYear:
2015
Language:
english
DOI:
10.1109/IWCE.2015.7301954
File:
PDF, 991 KB
english, 2015