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SPIE Proceedings [SPIE NDE for Health Monitoring and Diagnostics - San Diego, CA (Sunday 2 March 2003)] Testing, Reliability, and Application of Micro- and Nano-Material Systems - Microscopic NDE of hidden corrosion
Blackshire, James L., Hoffmann, Jochen, Kropas-Hughes, Claudia V., Tansel, Ibrahim, Meyendorf, Norbert, Baaklini, George Y., Michel, BerndVolume:
5045
Year:
2003
Language:
english
DOI:
10.1117/12.483999
File:
PDF, 845 KB
english, 2003