The robust detection and removal of unwanted asperities in applied surface metrology
Mark C. Malburg, Derek G. Chetwynd, Jayaraman RajaVolume:
38
Year:
1998
Language:
english
Pages:
11
DOI:
10.1016/s0890-6955(97)00064-3
File:
PDF, 237 KB
english, 1998