Formation of Ni Diffusion-Induced Surface Traps in...

Journal of Electronic Materials 2016 / 1 Vol. 45; Iss. 1

Formation of Ni Diffusion-Induced Surface Traps in GaN/AlxGa1−xN/GaN Heterostructures on Silicon Substrate During Gate Metal Deposition

Kajen, R. S., Bera, L. K., Tan, H. R., Dolmanan, S. B., Cheong, Z. W., Tripathy, S.
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Volume:
45
Language:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-015-4135-4
Date:
January, 2016
File:
PDF, 1.32 MB
english, 2016
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