Experimental fault-tolerant universal quantum gates with...

Nature Communications 2015 / 11 Vol. 6

Experimental fault-tolerant universal quantum gates with solid-state spins under ambient conditions

Rong, Xing, Geng, Jianpei, Shi, Fazhan, Liu, Ying, Xu, Kebiao, Ma, Wenchao, Kong, Fei, Jiang, Zhen, Wu, Yang, Du, Jiangfeng
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Volume:
6
Language:
english
Journal:
Nature Communications
DOI:
10.1038/ncomms9748
Date:
November, 2015
File:
PDF, 851 KB
english, 2015
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