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SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology 2015 - Beijing, China (Sunday 17 May 2015)] 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Absolute angular encoder based on optical diffraction
Zhu, Jigui, Tam, Hwa-Yaw, Xu, Kexin, Xiao, Hai, Han, Sen, Wu, Jian, Zhou, Tingting, Yuan, Bo, Wang, LiqiangVolume:
9623
Year:
2015
Language:
english
DOI:
10.1117/12.2191494
File:
PDF, 566 KB
english, 2015