Design and characterization of ESD solutions with EMC...

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Design and characterization of ESD solutions with EMC robustness for automotive applications

Xi, Yunfeng, Salcedo, Javier A., Zhou, Yuanzhong, Liou, Juin J., Hajjar, Jean-Jacques
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Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.09.018
Date:
September, 2015
File:
PDF, 1.87 MB
english, 2015
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