![](/img/cover-not-exists.png)
Design and characterization of ESD solutions with EMC robustness for automotive applications
Xi, Yunfeng, Salcedo, Javier A., Zhou, Yuanzhong, Liou, Juin J., Hajjar, Jean-JacquesLanguage:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.09.018
Date:
September, 2015
File:
PDF, 1.87 MB
english, 2015