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SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Metrology in Production Engineering - Signal modeling for modern interference microscopes
de Groot, Peter J., Colonna de Lega, Xavier, Osten, Wolfgang, Takeda, MitsuoVolume:
5457
Year:
2004
Language:
english
DOI:
10.1117/12.546226
File:
PDF, 93 KB
english, 2004