[IEEE 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hsinchu (2015.6.29-2015.7.2)] 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits - The demonstrations and discussion for static/read/write noise margin (SNM/RNM/WNM) via Nanoprobing to SRAM FA applications

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